✦ LIBER ✦
A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs
✍ Scribed by Seongmoon Wang; Chakradhar, S.T.
- Book ID
- 117907495
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 291 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0278-0070
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