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A statistical methodology for modeling and analysis of path delay faults in VLSI circuits

✍ Scribed by Mustapha Hamad; Sami Al-Arian; David Landis

Book ID: 114094093
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 852 KB
Volume: 23
Category: Article
ISSN: 0045-7906
DOI: 10.1016/s0045-7906(97)00017-7

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