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[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - A systematic approach to modeling and analysis of transient faults in logic circuits

โœ Scribed by Miskov-Zivanov, Natasa; Marculescu, Diana


Book ID
115525660
Publisher
IEEE
Year
2009
Tongue
English
Weight
669 KB
Volume
0
Category
Article
ISBN
1424429528

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