✦ LIBER ✦
On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits
✍ Scribed by Pomeranz, I.; Reddy, S.M.
- Book ID
- 117908429
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 288 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0278-0070
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