✦ LIBER ✦
Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers
✍ Scribed by Ahmed, N.; Tehranipoor, M.; Ravikumar, C.P.; Butler, K.M.
- Book ID
- 117907786
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 546 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0278-0070
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