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Trapping Effects in the Transient Response of AlGaN/GaN HEMT Devices

✍ Scribed by Jos Mara Tirado; Jos Luis Sanchez-Rojas; Jos Ignacio Izpura

Book ID: 114618629
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 534 KB
Volume: 54
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2006.890592

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