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Investigation of traps in AlGaN/GaN HEMTs by current transient spectroscopy

✍ Scribed by M. Gassoumi; J.M. Bluet; F. Chekir; I. Dermoul; H. Maaref; G. Guillot; A. Minko; V. Hoel; C. Gaquière

No coin nor oath required. For personal study only.

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