Current Collapse in AlGaN/GaN HEMTs Investigated by Electrical and Optical Characterizations

✍ Scribed by Mizutani, T. ;Ohno, Y. ;Akita, M. ;Kishimoto, S. ;Maezawa, K.

• Publisher: John Wiley and Sons
• Year: 2002
• Tongue: English
• Weight: 181 KB
• Volume: 194
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200212)194:2<447::aid-pssa447>3.0.co;2-7