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Transistor Mismatch Properties in Deep-Submicrometer CMOS Technologies

✍ Scribed by Xiaobin Yuan; Shimizu, T.; Mahalingam, U.; Brown, J.S.; Habib, K.Z.; Tekleab, D.G.; Tai-Chi Su; Satadru, S.; Olsen, C.M.; Hyunwoo Lee; Li-Hong Pan; Hook, T.B.; Jin-Ping Han; Jae-Eun Park; Myung-Hee Na; Rim, K.

Book ID: 114620278
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 722 KB
Volume: 58
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2010.2090159

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