✦ LIBER ✦
A total resistance slope-based effective channel mobility extraction method for deep submicrometer CMOS technology
✍ Scribed by Niu, G.; Cressler, J.D.; Mathew, S.J.; Subbanna, S.
- Book ID
- 114537883
- Publisher
- IEEE
- Year
- 1999
- Tongue
- English
- Weight
- 87 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0018-9383
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