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Suppression of hot-carrier effects in submicrometer CMOS technology

✍ Scribed by Chen Min-Liang; Leung Chung-Wai; Cochran, W.T.; Jungling, W.; Dziuba, C.; Yang Tungsheng

Book ID: 114538351
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 970 KB
Volume: 35
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.8795

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