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Modeling of Variation in Submicrometer CMOS ULSI Technologies

✍ Scribed by Springer, S.K.; Sungjae Lee; Ning Lu; Nowak, E.J.; Plouchart, J.-O.; Watts, J.S.; Williams, R.Q.; Zamdmer, N.

Book ID: 114618379
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 818 KB
Volume: 53
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2006.880165

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