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Characterization and implementation of self-aligned TiSi2 in submicrometer CMOS technology

✍ Scribed by Parekh, N.S.; Roede, H.; Bos, A.A.; Jonkers, A.G.M.; Verhaar, R.D.J.


Book ID
114537106
Publisher
IEEE
Year
1991
Tongue
English
Weight
791 KB
Volume
38
Category
Article
ISSN
0018-9383

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