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Total reflection X-ray fluorescence in the ultramicro analysis of artists' pigments

✍ Scribed by Luc Moens; Wim Devos; Reinhold Klockenkämper; Alex von Bohlen

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 844 KB
Volume: 13
Category: Article
ISSN: 0165-9936
DOI: 10.1016/0165-9936(94)85039-9

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