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Threshold voltage modelling and gate oxide thickness effect on polycrystalline silicon thin-film transistors

✍ Scribed by Gupta, Navneet

Book ID: 124069496
Publisher: Royal Swedish Academy of Sciences
Year: 2007
Tongue: English
Weight: 211 KB
Volume: 76
Category: Article
ISSN: 0031-8949
DOI: 10.1088/0031-8949/76/6/006

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