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Analytical Expressions for Doped Polycrystalline Silicon Thin-Film Transistors in Above-Threshold Regime Consistent With Pao–Sah Model Considering Trapped Charge Effect

✍ Scribed by Hongyu He; Xueren Zheng


Book ID
114620734
Publisher
IEEE
Year
2011
Tongue
English
Weight
276 KB
Volume
58
Category
Article
ISSN
0018-9383

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