A model of electrical conduction across the grain boundaries in polycrystalline-silicon thin film transistors and metal oxide semiconductor field effect transistors

✍ Scribed by Sharma, Kiran; Joshi, D. P.

• Book ID: 120078836
• Publisher: American Institute of Physics
• Year: 2009
• Tongue: English
• Weight: 533 KB
• Volume: 106
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.3173179