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Threshold Voltage Instability of SiC-MOSFETs on Various Crystal Faces

✍ Scribed by Senzaki, Junji; Shimozato, Atsushi; Kojima, Kazutoshi; Harada, Shinsuke; Ariyoshi, Keiko; Kojima, Takahito; Tanaka, Yasunori; Okumura, Hajime

Book ID: 127298237
Publisher: Trans Tech Publications, Ltd.
Year: 2014
Tongue: English
Weight: 575 KB
Volume: 778-780
Category: Article
ISSN: 1662-9752
DOI: 10.4028/www.scientific.net/msf.778-780.521

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