✦ LIBER ✦

ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - (Invited) Effect of Threshold-Voltage Instability on SiC Power MOSFET High-Temperature Reliability

✍ Scribed by Lelis, Aivars; Green, Ronald; Habersat, Daniel

No coin nor oath required. For personal study only.

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