✦ LIBER ✦

Thickness of the SiO2Si interface and composition of silicon oxide thin films: effect of wafer cleaning procedures

✍ Scribed by F.C. Stedile; I.J.R. Baumvol; I.F. Oppenheim; I. Trimaille; J.-J. Ganem; S. Rigo

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

IBA study of the growth mechanisms of ve

✍ F.C. Stedile; I.J.R. Baumvol; J.-J. Ganem; S. Rigo; I. Trimaille; G. Battistig; 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 648 KB

Influence of the silicon wafer cleaning

✍ B. Garrido; J. Samitier; J.R. Morante; L. Fonseca; F. Campabadal 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 296 KB

Microprobe technique for determining the

✍ Giulio Digiacomo 📂 Article 📅 1976 🏛 Elsevier Science 🌐 English ⚖ 596 KB

Phase retrieval from the spectral interf

✍ P. Hlubina; D. Ciprian; J. Luňáček; R. Chlebus 📂 Article 📅 2007 🏛 Springer 🌐 English ⚖ 520 KB

Catastrophic breakdown in silicon oxides

✍ Honda, Kouichirou; Nakanishi, Toshirou; Ohsawa, Akira; Toyokura, Nobuo 📂 Article 📅 1987 🏛 American Institute of Physics 🌐 English ⚖ 503 KB

The effect of silicon substrate on thick

✍ P. Hlubina; J. Luňáček; D. Ciprian 📂 Article 📅 2009 🏛 Springer 🌐 English ⚖ 301 KB