𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Catastrophic breakdown in silicon oxides: The effect of Fe impurities at the SiO2-Si interface

✍ Scribed by Honda, Kouichirou; Nakanishi, Toshirou; Ohsawa, Akira; Toyokura, Nobuo


Book ID
121823267
Publisher
American Institute of Physics
Year
1987
Tongue
English
Weight
503 KB
Volume
62
Category
Article
ISSN
0021-8979

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES