Thermal stability of copper nitride films prepared by rf magnetron sputtering
β Scribed by Z.Q Liu; W.J Wang; T.M Wang; S Chao; S.K Zheng
- Book ID
- 108389382
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 201 KB
- Volume
- 325
- Category
- Article
- ISSN
- 0040-6090
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π SIMILAR VOLUMES
Polycrystalline Zn 3 N 2 films are prepared on Si and quartz glass substrates by RF magnetron sputtering at room temperature. The structural and optical properties are studied by X-ray diffraction and double beam spectrophotometer, respectively. X-ray diffraction indicates that the Zn 3 N 2 films de
The studies of thermal stability of nitride coatings are important since their structural, thermal, electrical and optical properties are drastically modified by the oxidation layer formed on the top of these coatings. Tungsten nitride films were deposited from metallic tungsten target using reactiv