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Thermal mapping of defects in AlGaNâGaN heterostructure field-effect transistors using micro-Raman spectroscopy

✍ Scribed by Pomeroy, J. W.; Kuball, M.; Wallis, D. J.; Keir, A. M.; Hilton, K. P.; Balmer, R. S.; Uren, M. J.; Martin, T.; Heard, P. J.

Book ID: 121220134
Publisher: American Institute of Physics
Year: 2005
Tongue: English
Weight: 301 KB
Volume: 87
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2041823

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