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Temperature dependence of impact ionization in AlGaN–GaN heterostructure field effect transistors

✍ Scribed by Dyakonova, N.; Dickens, A.; Shur, M. S.; Gaska, R.; Yang, J. W.


Book ID
121482912
Publisher
American Institute of Physics
Year
1998
Tongue
English
Weight
248 KB
Volume
72
Category
Article
ISSN
0003-6951

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