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Measurement of temperature distribution in multifinger AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy

✍ Scribed by Kuball, M.; Rajasingam, S.; Sarua, A.; Uren, M. J.; Martin, T.; Hughes, B. T.; Hilton, K. P.; Balmer, R. S.

Book ID: 121399104
Publisher: American Institute of Physics
Year: 2003
Tongue: English
Weight: 435 KB
Volume: 82
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1534935

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