Time-Resolved Temperature Measurement of AlGaN/GaN Electronic Devices Using Micro-Raman Spectroscopy

✍ Scribed by Kuball, M.; Riedel, G. J.; Pomeroy, J. W.; Sarua, A.; Uren, M. J.; Martin, T.; Hilton, K. P.; Maclean, J. O.; Wallis, D. J.

• Book ID: 121273143
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 166 KB
• Volume: 28
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/LED.2006.889215