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Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy

✍ Scribed by Kuball, M.; Hayes, J.M.; Uren, M.J.; Martin, I.; Birbeck, J.C.H.; Balmer, R.S.; Hughes, B.T.

Book ID: 111903965
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 89 KB
Volume: 23
Category: Article
ISSN: 0741-3106
DOI: 10.1109/55.974795

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