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Three-dimensional thermal analysis of a flip-chip mounted AlGaN/GaN HFET using confocal micro-Raman spectroscopy
✍ Scribed by Hangfeng Ji; Kuball, M.; Sarua, A.; Jo Das; Ruythooren, W.; Germain, M.; Borghs, G.
- Book ID
- 114618456
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 456 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0018-9383
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