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Current collapse in AlGaN/GaN transistors studied using time-resolved Raman thermography

✍ Scribed by Simms, R. J. T.; Pomeroy, J. W.; Uren, M. J.; Martin, T.; Kuball, M.


Book ID
120544389
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
549 KB
Volume
93
Category
Article
ISSN
0003-6951

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