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Micro-Raman spectroscopy observation of field-induced strain relaxation in AlGaN/GaN heterojunction field-effect transistors

✍ Scribed by Dun, Shaobo ;Jiang, Yang ;Li, Jingqiang ;Fang, Yulong ;Yin, Jiayun ;Liu, Bo ;Wang, Jingjing ;Chen, Hong ;Feng, Zhihong ;Cai, Shujun

Book ID: 112180947
Publisher: John Wiley and Sons
Year: 2012
Tongue: English
Weight: 452 KB
Volume: 209
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.201127553

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