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Measurement of piezoelectrically induced charge in GaN/AlGaN heterostructure field-effect transistors

✍ Scribed by Yu, E. T.; Sullivan, G. J.; Asbeck, P. M.; Wang, C. D.; Qiao, D.; Lau, S. S.

Book ID: 120090912
Publisher: American Institute of Physics
Year: 1997
Tongue: English
Weight: 386 KB
Volume: 71
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.120138

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