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Theory and application of charge pumping for the characterization of Si-SiO2 interface and near-interface oxide traps

✍ Scribed by Paulsen, R.E.; White, M.H.

Book ID: 114535764
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 453 KB
Volume: 41
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.293349

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