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Imaging of oxide and interface charges in SiO2–Si

✍ Scribed by R Ludeke; E Cartier

Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 998 KB
Volume: 59
Category: Article
ISSN: 0167-9317
DOI: 10.1016/s0167-9317(01)00607-4

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