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Observation of near-interface oxide traps with the charge-pumping technique

โœ Scribed by Paulsen, R.E.; Siergiej, R.R.; French, M.L.; White, M.H.


Book ID
125438651
Publisher
IEEE
Year
1992
Tongue
English
Weight
255 KB
Volume
13
Category
Article
ISSN
0741-3106

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