๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Observation of single interface traps in submicron MOSFET's by charge pumping

โœ Scribed by Groeseneken, G.V.; De Wolf, I.; Bellens, R.; Maes, H.E.


Book ID
114536479
Publisher
IEEE
Year
1996
Tongue
English
Weight
738 KB
Volume
43
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES