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A Modified Charge-Pumping Method for the Characterization of Interface-Trap Generation in MOSFETs

✍ Scribed by Daming Huang; Liu, W.J.; Zhiying Liu; Liao, C.C.; Li-Fei Zhang; Zhenghao Gan; Waisum Wong; Ming-Fu Li


Book ID
114619298
Publisher
IEEE
Year
2009
Tongue
English
Weight
632 KB
Volume
56
Category
Article
ISSN
0018-9383

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