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A new charge-pumping technique for profiling the interface-states and oxide-trapped charges in MOSFETs

โœ Scribed by Yu-Lin Chu; Da-Wen Lin; Ching-Yuan Wu


Book ID
114538032
Publisher
IEEE
Year
2000
Tongue
English
Weight
186 KB
Volume
47
Category
Article
ISSN
0018-9383

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