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Determination of interface state density in MOSFETs using the spatial profiling charge pumping technique

✍ Scribed by X.M. Li; M.J. Deen

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 348 KB
Volume: 35
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(92)90005-w

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