✦ LIBER ✦
Influence of interface charge inhomogeneities on the measurement of surface state densities in Si-SiO2 interfaces by means of the MOS a.c. conductance technique : Paul A. Muls, Gilbert J. Declerck and Roger J. van Overstraeten. Solid-St. Electron. 20, 911 (1977)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 251 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0026-2714
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