Profiling of stress induced interface states in short channel MOSFETs using a composite charge pumping technique

✍ Scribed by H. Haddara; S. Cristoloveanu

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 590 KB
• Volume: 29
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(86)90177-2