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A novel charge-pumping method for extracting the lateral distributions of interface-trap and effective oxide-trapped charge densities in MOSFET devices

โœ Scribed by Hsin-Hsien Li; Yu-Lin Chu; Ching-Yuan Wu


Book ID
114536787
Publisher
IEEE
Year
1997
Tongue
English
Weight
290 KB
Volume
44
Category
Article
ISSN
0018-9383

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