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Observation and characterization of near-interface oxide traps with C-V techniques

✍ Scribed by Cohen, N.L.; Paulsen, R.E.; White, M.H.

Book ID: 114536336
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 662 KB
Volume: 42
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.469410

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