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The determination of interface layers by spectroscopic ellipsometry

✍ Scribed by J.B. Theeten; D.E. Aspnes

Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 450 KB
Volume: 60
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(79)90188-3

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