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Spectroscopic Ellipsometry for Characterization and Monitoring of Organic Layers

✍ Scribed by Arwin, H.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of 3C-SiC by Spectrosco

✍ R. Jansson; S. Zangooie; H. Arwin; K. Järrendahl 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 126 KB 👁 2 views

Characterization of Deposited Nanocrysta

✍ Bertin, F. ;Baron, Th. ;Mariolle, D. ;Martin, F. ;Chabli, A. ;Dupuy, M. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 359 KB 👁 2 views

Optical Characterization of Cubic AlGaN

✍ H. Okumura; T. Koizumi; Y. Ishida; H. Yaguchi; S. Yoshida 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 154 KB 👁 2 views

Optical characterization of inhomogeneou

✍ D. Franta; I. Ohlídal 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 89 KB 👁 2 views

ChemInform Abstract: Structural Analysis

✍ Joseph L. Keddie 📂 Article 📅 2010 🏛 John Wiley and Sons ⚖ 23 KB

Spectroscopic Ellipsometry in-situ Monit

✍ Yoshikawa, A. ;Xu, K. ;Taniyasu, Y. ;Takahashi, K. 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 322 KB 👁 2 views