In this paper results concerning optical analysis of the SiO 2 =Si system performed by the combined ellipsometric and reflectometric method used in multiple-sample modification will be presented. This method is based on combining both the single-wavelength method and the dispersion method. Three mod
Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry
✍ Scribed by D. Franta; I. Ohlídal
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 89 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0142-2421
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