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Characterization of 3C-SiC by Spectroscopic Ellipsometry

✍ Scribed by R. Jansson; S. Zangooie; H. Arwin; K. Järrendahl

Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
126 KB
Volume
218
Category
Article
ISSN
0370-1972

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