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Optical Constants of Polycrystalline Cd1−xZnxTe Thin Films by Spectroscopic Ellipsometry

✍ Scribed by K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy

Publisher: John Wiley and Sons
Year: 1997
Tongue: English
Weight: 127 KB
Volume: 7
Category: Article
ISSN: 1616-301X
DOI: 10.1002/(sici)1099-0712(199705)7:3<109::aid-amo296>3.0.co;2-4

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✦ Synopsis

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x Te thin films formed on Corning 7059 glass substrates. The experimental spectra were measured in the photon energy range 1.1-5.6 eV. The spectra revealed distinct peaks at energies corresponding to interband transitions. *

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