✦ LIBER ✦

Determination of Complex Optical Constants of Uniaxial HgI2 by Spectroscopic Conventional and Generalized Ellipsometry

✍ Scribed by En Naciri, A. ;Johann, L. ;Kleim, R. ;Sieskind, M. ;Amann, M.

Publisher: John Wiley and Sons
Year: 1999
Tongue: English
Weight: 233 KB
Volume: 175
Category: Article
ISSN: 0031-8965
DOI: 10.1002/(sici)1521-396x(199909)175:1<413::aid-pssa413>3.0.co;2-y

No coin nor oath required. For personal study only.

✦ Synopsis

The conventional ellipsometry can be applied to determine the optical properties of anisotropic materials only if the measurements are made for in-plane uniaxial anisotropy of the bulk sample with the optic axis parallel or perpendicular to the plane of incidence. For arbitrarily oriented anisotropic materials, the generalized ellipsometry method should be used. The generalized fixed polarizer, rotating-polarizer and fixed analyzer spectroscopic ellipsometry was used. The method is experimentally verified for uniaxial mercuric iodide (HgI 2 ). The normalized Jones matrix and the complex optical functions are extracted from the measured Fourier coefficients at different sample orientations and different polarizer and analyzer angles P and A.

📜 SIMILAR VOLUMES

Optical Constants of Polycrystalline Cd1

Optical Constants of Polycrystalline Cd1−xZnxTe Thin Films by Spectroscopic Ellipsometry

✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 127 KB 👁 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x