✦ LIBER ✦

Characterization of SiO2GaAs interface structures using spectroscopic ellipsometry

✍ Scribed by Y. Watanabe; T. Saitoh; M. Miyazaki; K. Suzuki

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Investigation of the system InSbSiO2 by

✍ S. Russev; E. Valcheva; K. Germanova 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 371 KB

In-situ and ex-situ characterization of

✍ J.L. Edwards; G.N. Maracas; K.T. Shiralagi; K.Y. Choi; R. Droopad 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 474 KB

Characterization of In0.48Ga0.52P-based

✍ Kenichi Watanabe; Kenichiro Kobayashi; Cheong Chee Wong; Yi-Ming Xiong; Tadashi 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 676 KB

Characterization of crystallites at the

✍ C. Nozaki; S. Yasuami; H. Ishimura; H. Tokuda 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 608 KB

Non-destructive characterization of III–

✍ C. Pickering; R.T. Carline; N.S. Garawal; J.L. Stehlé; J.P. Piel; R. Blunt; P. K 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 378 KB

Characterization of different porous sil

✍ M Fried; T Lohner; O Polgár; P Petrik; É Vázsonyi; I Bársony; J.P Piel; J.L Steh 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 454 KB