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CO2 sorption of a thin silica layer determined by spectroscopic ellipsometry

โœ Scribed by Nieck E. Benes; Gerald Spijksma; Henk Verweij; Herbert Wormeester; Bene Poelsema

Publisher
American Institute of Chemical Engineers
Year
2001
Tongue
English
Weight
166 KB
Volume
47
Category
Article
ISSN
0001-1541

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The major optical technique applied in this paper is spectroscopic ellipsometry. Ellipsometry measures the polarization change of the light due to interaction with the sample surface. It is called 'spectroscopic' if the measurement is performed at various wavelengths within a spectral interval. Spec